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Accueil du site > ANGLAIS > AIFIRA Home > About AIFIRA Facility > Macrometric beam line


Macrometric beam line

The macrometric beam line provides a stationary millimetric ion beam (from 0.5 to 2 mm depending on the collimator size in the analysis chamber). RBS, PIXE, NRA are available for the analysis of a wide range of bulk materials.

 

Description of the analysis chamber

 

The chamber features a manual sample changer allowing a continuous analysis of several samples. The maximum sample diameter authorized is thus of 25 mm. Bigger samples can also be analysed but the maximum viability size is about 10 cm. The angle of the changer can be changed in order to perform grazing incidence analysis.

 

The angle of the RBS detector is adjustable for the experimental needs. A PIXE detector can be added in order to have simultaneous analysis.

 

Furthermore, the cover of the chamber can be removed and a cover with two goniometers adapted for RBS channelling can be installed.

 

DSCF1452_b

Macrobeam chamber

 

Analysis performed in the macrobeam chamber

 

The most current analysis are RBS and PIXE who give structural information on the elementary composition and the homogeneity of samples. The RBS is also used, in normal or in grazing incidence, to determine the thickness and the composition of thin deposits of some tens of Angström. The studied materials are most part dedicated to microelectronic applications.

 

Communications

 

    2012

U.C. Chung et al. Thin Films Sol, 520, 1997-2000

 

    2011

R. Bodeux et al. Thin Films Sol, soumis

B. Fleutôt et al. J. Power Sources 196, 10289-10296

 

    2010

F. Natali et al. Jpn J Appl Phys 49, 025505

F. Natali et al. J. Cryst. Growth 312, 3583-3587

 

    2009

D. Michau et al. J Phys D Appl Phys 42, 075407

 

    2008

M.V. Reddy et al. Mater Res Bull 43, 1519-1527

 

    2007

M. Urien et al. Organic Electronics 8, 727-734

 

    2006

M.V. Reddy et al. Nuc Instr Meth Phys Res B 246, 397-401